GOEPEL electronic, a specialized supplier for testing automotive E/E (Electrical/Electronic) architectures, has unveiled the updated, next-generation Network Tester NG+. This latest offering from GOEPEL electronic leverages the high-performance Series 62 platform to meet current and future technology requirements in the automotive industry.

The new NG+ system architecture supports a wide range of classic bus systems, including CAN-FD, CAN-SIG, LIN, and FlexRay, as well as the latest Automotive Ethernet (AETH) standards – 10BASE-T1S, 100BASE-T1, and 1000BASE-T1. Additionally, the system is prepared for future trends such as CAN-XL.

"Our aim in network test is to determine whether a control unit sends and receives data in accordance with specifications under all possible operating conditions in the vehicle. This allows us to simulate and test whether the control unit complies with the standard or whether it impairs communication within the vehicle environment. With our new generation of network testers, previous test scenarios can be optimised and at the same time the focus can be placed on state-of-the-art requirements," explains Michael Schmidt, Senior Team Manager at GOEPEL electronic.

The scalable NG+ family is designed to accommodate both individual tests and network/integration tests. This is facilitated by an optional NG+ extension system, which enables tests with a high number of interfaces, including domain controller ECUs or complete vehicle assemblies. A core feature is the time synchronisation between the systems and their physical parameters across the various interfaces. Backed by a snapshot logging function for all test-relevant communication interfaces and real-time-capable event/action handling, a wide variety of test tasks can be realized. The system also features stress and trigger modules for CAN-FD, LIN, and FlexRay, as in the previous version.

The automation and implementation of the test cases are carried out using AUTOSAR-compliant tool chains, where ECU-specific test sequences are compiled from generic templates. The resulting test reports enable efficient fault analysis and can be seamlessly integrated into higher-level data management systems.